Showing results: 406 - 420 of 683 items found.
-
Circuit Check, Inc.
Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
-
Extech MA620 -
Extech Instruments Corporation
MA620 is a True RMS, autoranging AC clamp meters offer plant maintenance techs, electrical troubleshooters, and DIYers a test instrument that delivers a combination of high performance and exceptional value. In addition to a host of advanced multimeter and current measurement capabilities, it also has a built-in, non-contact (NCV) voltage detector. You can select auto- or manual-ranging modes, measurement functions cover all types of troubleshooting over and above noninvasive current probe measurements: voltage, resistance, capacitance, frequency, duty cycle, diode and continuity tests. Even measure temperature with the supplied Type K bead wire probe. Complete with test leads, general purpose Type K bead wire temperature probe, 9V battery and carrying case.
-
Keysight Technologies
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
-
Rohde & Schwarz GmbH & Co. KG
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
-
Test Coach Corporation
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
-
Smiths Interconnect
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
-
597 -
Electronic Specialties Inc.
*CATIII 1000 Volt / CATIV 600 Volt Approved & Safety Rated *Safe For Use on Hybrids and EV's *Highest Quality Auto-Ranging DMM Designed for Automotive Trouble Shooting *18 Test Functions, 48 Test Ranges *Peak Min/Max records transient voltages as fast as 1 millisecond *Min/Max Mode records variations in all functions *Also measures Temperature via Temp Probe in Both F and C *Milliseconds Pulse Width Measures Fuel Injector ON-TIME *Inductive RPM Readings for both DIS and Conventional Ignitions *Desirable 20 Amp Test Range - Dual Fuse Protection *Modern Design, the Protective Holster is Built Into the Housing *Data Hold, Auto Power-Off, + Trigger Adjust *Large LCD Display w/White LED Backlighting and 40 Segment Analog Bargraph *Blow Mold Case, Test Leads, K-Type Temp Probe, Inductive RPM Clamp and Instructions included *Waterproof to IP67 Standards
-
597IR -
Electronic Specialties Inc.
*Highest Quality Auto-Ranging DMM Designed for Automotive Trouble Shooting *18 Test Functions, 48 Test Ranges *Peak Min/Max records transient voltages as fast as 1 millisecond *Min/Max Mode records variations in all functions *Exclusive Non-Contact IR Thermometer Adapter Included - 1022F/550C max temp readings *Also measures Temperature via Temp Probe in Both F and C *Milliseconds Pulse Width Measures Fuel Injector ON-TIME *Inductive RPM Readings for both DIS and Conventional Ignitions *Desirable 20 Amp Test Range - Dual Fuse Protection *Modern Design, the Protective Holster is Built Into the Housing *Data Hold, Auto Power-Off, + Trigger Adjust *Large LCD Display w/White LED Backlighting and 40 Segment Analog Bargraph *Blow Mold Case, Test Leads, IR Thermometer Adapter, K-Type Temp Probe, Inductive RPM Clamp and Instructions included
-
1951 -
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable for earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
-
1952 -
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable for earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
-
1953 -
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
-
1954 -
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
-
ST-3347W -
Standard Instruments Co., LTD.
This clamp meter provides accurate AC, AC/DC current and voltage readings regardless of the waveforms. This meter can use in most industrial and commercial applications where non-linear loads distort the current or voltage waveform. Reliable operation. Features accessories such as test leads, carrying case and temperature probe.
-
LCD 2424 -
Korima, Inc.
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
-
Yelo Ltd.
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
